CTFL-AuT Dumps - Grab Out For [NEW-2023] ISQI Exam [Q21-Q36]
CTFL-AuT Dumps - Grab Out For [NEW-2023] ISQI Exam
CTFL-AuT Exam Dumps PDF Guaranteed Success with Accurate & Updated Questions
ISQI CTFL-AuT Exam Syllabus Topics:
Topic | Details |
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Topic 1 | - Classification of the XiL test environments (MiL, SiL, HiL) in the general V-model
- The influence of criticality on the extent of the test (K2)
| Topic 2 | - Quality characteristics for reviews of requirements (K3)
- Functional safety and safety culture (K2)
| Topic 3 | - Application areas and boundary conditions of a SiL test environment
- Automotive-specific static and dynamic test techniques
| Topic 4 | - Assessment levels and capability indicators
- Project aspects influenced by standards (K1)
| Topic 5 | - Influence of ASIL on test techniques, test types and the extent of the test
- Process categories in the process dimension
| Topic 6 | - Advantages and disadvantages oftesting in the XiL test environments
- Integration of the tester in the safety lifecyle (K2)
| Topic 7 | - Differences between Closed-Loop and Open-Loop (K2)
- Contribution of the tester to the safety culture
| Topic 8 | - Essential interfaces, databases and communication protocols of a electronic control unit (K1)
- Requirements of the standard (K3)
| Topic 9 | - Verification strategy and criteria for unit verification (SWE.4)
- Motivation for a test environment in the automotive development (K1)
| Topic 10 | - Structure and test specific parts of the standard (K1)
- The contribution
- participation of the tester in the release process (K1)
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